Semiconductor Wafer Defects Detection using Yolov5 Model

Registration ID: IJNRD_193926

Published ID: IJNRD2310164

DOI: Click Here to Get

NAGI SIVA KUMAR , RAJAN KUMAR MAHATO , Dr. S. Jana

YOLO, RECALL, PRECESION, CNN

Wafer defect detection is an important step in the semiconductor manufacturing process because it ensures the final product’s quality and reliability. Traditional wafer defect detection methods can be slow and error-prone, and they may be incapable of detecting small or complex defects. Machine learning algorithms such as convolutional neural networks (CNNs) have been used to detect wafer defects with promising results in recent years. YOLO (You Only Look Once), a popular object detection algorithm based on CNNs, is one such algorithm. YOLO has gone through several iterations, including YOLOv1, YOLOv2, YOLOv3, YOLOv4 and, YOLOv5 are most recent one. The YOLOv5 algorithm is the most recent version and powerful, and it includes several improvements over previous versions, such as a new object detector and a more efficient network architecture. In this research, we use YOLO v5 to detect wafer defects and evaluate its performance on a wafer image dataset. In this paper, we compare the accuracy of different YOLOv5 models. Our results show that YOLOv5x can detect wafer defects with high accuracy and speed, outperforming traditional wafer defect detection methods.

Published Paper   E-Certificate

NAGI SIVA KUMAR, RAJAN KUMAR MAHATO, & Dr. S. Jana (October-2023). Semiconductor Wafer Defects Detection using Yolov5 Model. INTERNATIONAL JOURNAL OF NOVEL RESEARCH AND DEVELOPMENT, 8(10), b601-b606. https://ijnrd.org/papers/IJNRD2310164.pdf

Volume 8 Issue 10, October-2023

Pages : b601-b606

Paper Reg. ID: IJNRD_193926

Published Paper Id: IJNRD2310164

Downloads: 000121994

Research Area: Electronics & Communication Engg. 

Country: Chennai, Tamil Nadu, India

Published Paper PDF: https://ijnrd.org/papers/IJNRD2310164.pdf

Published Paper URL: https://ijnrd.org/viewpaperforall?paper=IJNRD2310164

Journal Name: INTERNATIONAL JOURNAL OF NOVEL RESEARCH AND DEVELOPMENT(IJNRD)

ISSN: 2456-4184 | IMPACT FACTOR: 8.76 Calculated By Google Scholar | ESTD YEAR: 2016

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